Yellow rust in wheat occurs annually in most wheat-growing areas in Iran. The identification of molecular markers linked to yellow rust resistance
has the potential to improve the efficiency of selection in wheat breeding programs. DNA Amplification Fingerprinting (DAF) technology was used with the objective of identifying DNA markers linked to the yellow rust resistance. Two bulks were made by pooling extracted DNA, each bulk (one resistant and one susceptible) being resulted from an F2 population obtained
from a cross between a susceptible and a resistant parent. The bulks were evaluated with many random primers. One primer produced a band which was
associated with the traget gene Yr5.
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