In order to study genetic variation of different traits in doubled haploid lines of bread wheat (Ttriticum aestivum L.) derived from cross of two foreign cultivars of Fukuho-Kumogi and Oligo-Culm, 157 doubled haploid lines were evaluated for morphological and agronomical traits using a randomized complete block design with 3 replications in research farm of Isfahan University of Technology. Phenotypic and genotypic coefficients of variation showed that the doubled haploid lines had more variation for length of peduncle, number of fertile spike/m2, plant height, grain number/spike and grain yield/spike than the other traits such as test weight, days to maturity, days to heading and days to pollination. Genetic coefficient of variation for days to maturity, plant height, sipke/m2 and grain yield/m2 were 1.2%, 20.7%, 19.9% and 13.7%, respectively. The estimates of narrow-sense heritability were high for most of the trait, and varied between 63% for grain yield/m2 to 99% for plant height. Cluster analysis based on studied traits classified the genotypes to 3 distinct groups. The mean squares between groups were highly significant for all of the traits, except for grain yield/m2. The groups of 1, 2, and 3 Containal 54, 55 and 50 genotypes, respectively. The result of this study showed that there was considerable genetic variation for agronomic and economical traits among the doubled haploid lines and that these traits can be improved through selection programs. The estimate of heritablility for grain yield was relatively low, however, the yield components such as grains/spike, grain yield/spike and 1000-grain weight had high estimates of heritabilities and therefor can be used as selection indices for grain yield improvement.
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